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1

On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications

Barragan, Manuel J., Leger, Gildas, Vazquez, Diego, Rueda, Adoracion

Journal:

Analog Integrated Circuits and Signal Processing

Year:

2015

Language:

english

File:

PDF, 1.83 MB

english, 2015

2

[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration

Cilici, Florent, Barragan, Manuel J., Mir, Salvador, Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas

Year:

2019

Language:

english

File:

PDF, 410 KB

english, 2019

3

[IEEE 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Lausanne, Switzerland (2019.7.15-2019.7.18)] 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Feature selection and feature design for machine learning indirect test: a tutorial review

Barragan, Manuel J., Leger, Gildas

Year:

2019

Language:

english

File:

PDF, 576 KB

english, 2019

4

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Mixed-signal test automation: Are we there yet?

Leger, Gildas, Barragan, Manuel J.

Year:

2018

Language:

english

File:

PDF, 206 KB

english, 2018

5

[IEEE 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Lausanne, Switzerland (2019.7.15-2019.7.18)] 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits

Cilici, Florent, Leger, Gildas, Barragan, Manuel J., Mir, Salvador, Lauga-Larroze, Estelle, Bourdcl, Sylvain

Year:

2019

Language:

english

File:

PDF, 1.22 MB

english, 2019

6

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Combining Adaptive Alternate Test and Multi-Site

Year:

2015

Language:

english

File:

PDF, 131 KB

english, 2015

7

Assessing AMS-RF Test Quality by Defect Simulation

Gutierrez Gil, Valentin, Gines Arteaga, Antonio J., Leger, Gildas

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2019

Language:

english

File:

PDF, 1.17 MB

english, 2019

8

[IEEE 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - MontrÃ©al, QC, Canada (2020.6.16-2020.6.19)] 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - Non-Linear Calibration of Pipeline ADCs using a Histogram-Based Estimation of the Redundant INL

Gines, Antonio, Leger, Gildas, Peralias, Eduardo

Year:

2020

File:

PDF, 1.35 MB

2020

9

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - OBT for settling error test of sampled-data systems using signal-dependent clocking

Barragan, Manuel J., Leger, Gildas, Huertas, Jose L.

Year:

2012

Language:

english

File:

PDF, 587 KB

english, 2012

10

Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures

Manuel J. Barragán, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas

Journal:

Journal of Electronic Testing

Year:

2011

Language:

english

File:

PDF, 544 KB

english, 2011

11

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Sigma-delta testability for pipeline A/D converters

Gines, Antonio, Leger, Gildas

Year:

2014

Language:

english

File:

PDF, 475 KB

english, 2014

12

Brownian distance correlation-directed search: A fast feature selection technique for alternate test

Leger, Gildas, Barragan, Manuel J.

Journal:

Integration, the VLSI Journal

Year:

2016

Language:

english

File:

PDF, 1.13 MB

english, 2016

13

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Sigma-delta testability for pipeline A/D converters

Gines, Antonio, Leger, Gildas

Year:

2014

Language:

english

File:

PDF, 475 KB

english, 2014

14

Guest Editorial: Analog, Mixed-Signal and RF Testing

Gildas Léger,Carsten Wegener

Journal:

Journal of Electronic Testing

Year:

2016

Language:

english

File:

PDF, 190 KB

english, 2016

15

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs

Barragan, Manuel J., Fiorelli, Rafaella, Leger, Gildas, Rueda, Adoracion, Huertas, Jose L.

Year:

2011

Language:

english

File:

PDF, 366 KB

english, 2011

16

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - Special session: Hot topics: Statistical test methods

Barragan, Manuel J., Leger, Gildas, Azais, Florence, Blanton, R. D., Singh, Adit D., Sunter, Stephen

Year:

2015

Language:

english

File:

PDF, 94 KB

english, 2015

17

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Questioning the reliability of Monte Carlo simulation for machine learning test validation

Leger, Gildas, Barragan, Manuel J.

Year:

2016

Language:

english

File:

PDF, 344 KB

english, 2016

18

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Boundary cost optimization for Alternate Test

Year:

2015

Language:

english

File:

PDF, 406 KB

english, 2015

19

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Feature Selection for Alternate Test using Wrappers: Application to an RF LNA Case Study

Barragan, Manuel J., Leger, Gildas

Year:

2015

Language:

english

File:

PDF, 225 KB

english, 2015

20

[IEEE 2017 International Mixed Signals Testing Workshop (IMSTW) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 International Mixed Signals Testing Workshop (IMSTW) - Likelihood-sampling adaptive fault simulation

Leger, Gildas, Gines, Antonio

Year:

2017

Language:

english

File:

PDF, 515 KB

english, 2017

21

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Efficient selection of signatures for analog/RF alternate test

Barragan, Manuel J., Leger, Gildas

Year:

2013

Language:

english

File:

PDF, 500 KB

english, 2013

22

[IEEE 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Lyon, France (2018.11.14-2018.11.16)] 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Single Event Transient injection in large mixed-signal circuits

Gutierrez, Valentin, Leger, Gildas

Year:

2018

Language:

english

File:

PDF, 767 KB

english, 2018

23

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Doubly-segmented current-steering DAC calibration

Year:

2014

Language:

english

File:

PDF, 414 KB

english, 2014

24

A procedure for Alternate Test feature design and selection

Barragan, Manuel, Leger, Gildas

Journal:

IEEE Design and Test

Year:

2014

Language:

english

File:

PDF, 497 KB

english, 2014

25

On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits

Diego Vázquez, Gloria Huertas, Gildas Leger, Eduardo Peralías, Adoración Rueda, José Luis Huertas

Journal:

Analog Integrated Circuits and Signal Processing

Year:

2002

Language:

english

File:

PDF, 179 KB

english, 2002

26

[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - Multi-condition alternate test of analog, mixed-signal, and RF systems

Barragan, Manuel J., Leger, Gildas, Huertas, Jose L.

Year:

2012

Language:

english

File:

PDF, 1005 KB

english, 2012

27

[IEEE 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Istanbul, Turkey (2015.9.7-2015.9.9)] 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - A hybrid method for feature selection in the context of alternate test

Leger, Gildas, Barragan, Manuel J.

Year:

2015

Language:

english

File:

PDF, 523 KB

english, 2015

28

A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits

Cilici, Florent, Barragan, Manuel J., Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2020

File:

PDF, 3.84 MB

2020

29

[IEEE 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - MontrÃ©al, QC, Canada (2020.6.16-2020.6.19)] 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS) - On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits

Gutierrez, Valentin, Leger, Gildas

Year:

2020

File:

PDF, 1.25 MB

2020

30

[IEEE 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) - Bilbao, Spain (2019.11.20-2019.11.22)] 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) - SET sensitivity evaluation, a comparison before and after layout

Gutierrez, Valentin, Leger, Gildas

Year:

2019

File:

PDF, 6.93 MB

2019

31

On Chopper Effects in Discrete-Time $\Sigma\Delta$ Modulators

Leger, Gildas, Gines Arteaga, Antonio J., Peralias Macias, Eduardo J., Rueda, Adoración

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2010

Language:

english

File:

PDF, 1.59 MB

english, 2010

32

An adaptive simulation framework for AMS-RF test quality

Gutierrez, Valentin, Leger, Gildas

Journal:

Integration, the VLSI Journal

Year:

2020

File:

PDF, 1.22 MB

2020

33

Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST

Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragán, Gildas Leger, Adoración Rueda, José L. Huertas

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 375 KB

english, 2005

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